Studying atomic structures by aberration-corrected transmission electron microscopy

被引:283
作者
Urban, Knut W. [1 ,2 ]
机构
[1] Forschungszentrum Julich, Helmholtz Res Ctr, Inst Solid State Res, D-52425 Julich, Germany
[2] Forschungszentrum Julich, Helmholtz Res Ctr, Ernst Ruska Ctr Microscopy & Spect Electrons, D-52425 Julich, Germany
关键词
D O I
10.1126/science.1152800
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Seventy- five years after its invention, transmission electron microscopy has taken a great step forward with the introduction of aberration- corrected electron optics. An entirely new generation of instruments enables studies in condensed- matter physics and materials science to be performed at atomic- scale resolution. These new possibilities are meeting the growing demand of nanosciences and nanotechnology for the atomic- scale characterization of materials, nanosynthesized products and devices, and the validation of expected functions. Equipped with electron- energy filters and electron- energy- loss spectrometers, the new instruments allow studies not only of structure but also of elemental composition and chemical bonding. The energy resolution is about 100 milli- electron volts, and the accuracy of spatial measurements has reached a few picometers. However, understanding the results is generally not straightforward and only possible with extensive quantum- mechanical computer calculations.
引用
收藏
页码:506 / 510
页数:5
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