Non-optically probing near-field microscopy

被引：44

作者：

Kawata, Y ^{[1
]}

Egami, C

Nakamura, O

Sugihara, O

Okamoto, N

Tsuchimori, M

Watanabe, O

机构：

[1] Shizuoka Univ, Fac Engn, Joho Ku, Hamamatsu, Shizuoka 4328561, Japan

[2] Osaka Univ, Dept Appl Phys, Osaka, Japan

[3] Toyota Cent Res & Dev Inc, Nagoya, Aichi, Japan

来源：

OPTICS COMMUNICATIONS | 1999年 / 161卷 / 1-3期

关键词：

D O I：

10.1016/S0030-4018(98)00621-X

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a near-field optical microscope without the use of a probe for illumination or detection or scattering of the optical fields. In our system the optical fields near specimens are converted to the topographical change of a photosensitive film, and then the topography is detected with an atomic force microscope. Urethane-urea copolymer films are used for the conversion material from the optical fields to the topography. We succeeded in imaging with a resolution higher than 50 nm, (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：6 / 12

页数：7