Non-optically probing near-field microscopy

被引：44
作者：
Kawata, Y [1 ]
Egami, C
Nakamura, O
Sugihara, O
Okamoto, N
Tsuchimori, M
Watanabe, O
机构：
[1] Shizuoka Univ, Fac Engn, Joho Ku, Hamamatsu, Shizuoka 4328561, Japan
[2] Osaka Univ, Dept Appl Phys, Osaka, Japan
[3] Toyota Cent Res & Dev Inc, Nagoya, Aichi, Japan
来源：
OPTICS COMMUNICATIONS | 1999年 / 161卷 / 1-3期
关键词：
D O I：
10.1016/S0030-4018(98)00621-X
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a near-field optical microscope without the use of a probe for illumination or detection or scattering of the optical fields. In our system the optical fields near specimens are converted to the topographical change of a photosensitive film, and then the topography is detected with an atomic force microscope. Urethane-urea copolymer films are used for the conversion material from the optical fields to the topography. We succeeded in imaging with a resolution higher than 50 nm, (C) 1999 Elsevier Science B.V. All rights reserved.
引用
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页码：6 / 12
页数：7
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