Measurement and compensation of misalignment in double-sided hard X-ray Fresnel zone plates

被引:2
作者
Yurgens, Viktoria [1 ,3 ]
Koch, Frieder [1 ]
Scheel, Mario [2 ]
Weitkamp, Timm [2 ]
David, Christian [1 ]
机构
[1] Paul Scherrer Inst, CH-4056 Villigen, Switzerland
[2] Synchrotron SOLEIL, Gif Sur Yvette 91192, France
[3] Univ Basel, Klingelbergstr 82, Basel, Switzerland
关键词
X-ray optics; Fresnel zone plate; diffraction efficiency; microfocus X-ray source; EFFICIENCY; STACKING; OPTICS; FIELD;
D O I
10.1107/S1600577520001757
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Double-sided Fresnel zone plates are diffractive lenses used for high-resolution hard X-ray microscopy. The double-sided structures have significantly higher aspect ratios compared with single-sided components and hence enable more efficient imaging. The zone plates discussed in this paper are fabricated on each side of a thin support membrane, and the alignment of the zone plates with respect to each other is critical. Here, a simple and reliable way of quantifying misalignments by recording efficiency maps and measuring the absolute diffraction efficiency of the zone plates as a function of tilting angle in two directions is presented. The measurements are performed in a setup based on a tungsten-anode microfocus X-ray tube, providing an X-ray energy of 8.4 keV through differential measurements with a Cu and an Ni filter. This study investigates the sources of the misalignments and concludes that they can be avoided by decreasing the structure heights on both sides of the membrane and by pre-programming size differences between the front- and back-side zone plates.
引用
收藏
页码:583 / 589
页数:7
相关论文
共 17 条
  • [1] Bergamaschi A., 2018, Synchrotron Radiation News, V31, P11, DOI 10.1080/08940886.2018.1528428
  • [2] EFFECTS OF DIFFRACTION EFFICIENCY ON THE MODULATION TRANSFER-FUNCTION OF DIFFRACTIVE LENSES
    BURALLI, DA
    MORRIS, GM
    [J]. APPLIED OPTICS, 1992, 31 (22) : 4389 - 4396
  • [3] Chen S, 2008, J X-RAY SCI TECHNOL, V16, P235
  • [4] Fresnel zone plate stacking in the intermediate field for high efficiency focusing in the hard X-ray regime
    Gleber, Sophie-Charlotte
    Wojcik, Michael
    Liu, Jie
    Roehrig, Chris
    Cummings, Marvin
    Vila-Comamala, Joan
    Li, Kenan
    Lai, Barry
    Shu, Deming
    Vogt, Stefan
    [J]. OPTICS EXPRESS, 2014, 22 (23): : 28142 - 28153
  • [5] Zone-doubling technique to produce ultrahigh-resolution x-ray optics
    Jefimovs, K.
    Vila-Comamala, J.
    Pilvi, T.
    Raabe, J.
    Ritala, M.
    David, C.
    [J]. PHYSICAL REVIEW LETTERS, 2007, 99 (26)
  • [6] PHASE ZONE PLATES FOR X-RAYS AND EXTREME UV
    KIRZ, J
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (03) : 301 - 309
  • [7] Systematic efficiency study of line-doubled zone plates
    Marschall, F.
    Vila-Comamala, J.
    Guzenko, V. A.
    David, C.
    [J]. MICROELECTRONIC ENGINEERING, 2017, 177 : 25 - 29
  • [8] Near-field stacking of zone plates in the x-ray range
    Maser, J
    Lai, B
    Yun, W
    Shastri, SD
    Cai, Z
    Rodrigues, W
    Xu, S
    Trackhtenberg, E
    [J]. DESIGN AND MICROFABRICATION OF NOVEL X-RAY OPTICS, 2002, 4783 : 74 - 81
  • [9] High resolution double-sided diffractive optics for hard X-ray microscopy
    Mohacsi, Istvan
    Vartiainen, Ismo
    Guizar-Sicairos, Manuel
    Karvinen, Petri
    Guzenko, Vitaliy A.
    Mueller, Elisabeth
    Farm, Elina
    Ritala, Mikko
    Kewish, Cameron M.
    Somogyi, Andrea
    David, Christian
    [J]. OPTICS EXPRESS, 2015, 23 (02): : 776 - 786
  • [10] Measurements with MONCH, a 25 μm pixel pitch hybrid pixel detector
    Ramilli, M.
    Bergamaschi, A.
    Andrae, M.
    Bruckner, M.
    Cartier, S.
    Dinapoli, R.
    Frojdh, E.
    Greiffenberg, D.
    Hutwelker, T.
    Lopez-Cuenca, C.
    Mezza, D.
    Mozzanica, A.
    Ruat, M.
    Redford, S.
    Schmitt, B.
    Shi, X.
    Tinti, G.
    Zhang, J.
    [J]. JOURNAL OF INSTRUMENTATION, 2017, 12