Empirical comparison of software-based error detection and correction techniques for embedded systems

被引：0

作者：

Ong, RHL ^{[1
]}

Pont, MJ ^{[1
]}

机构：

[1] Univ Leicester, Dept Engn, Leicester LE1 7RH, Leics, England

来源：

PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON HARDWARE/SOFTWARE CODESIGN | 2001年

关键词：

instruction pointer corruption; electromagnetic interference; EMI; function token; NOP fill; software-based error detection techniques; embedded systems;

D O I：

10.1109/HSC.2001.924681

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Function Tokens and "NOP Fills" are two methods proposed by various authors to deaf with Instruction Pointer corruption in microcontrollers, especially in the presence of high electromagnetic interference levels. An empirical analysis to assess and compare these two techniques is presented in this paper. Two main conclusions are drawn: [1] NOP Rile are a powerful technique for improving the reliability of embedded applications in the presence of EMI, and [2] the use of Function Tokens can lead to a reduction in overall system reliability.

引用

页码：230 / 235

页数：6