Multiple aging mechanisms in relaxor ferroelectrics

被引：52
作者：
Colla, EV [1 ]
Chao, LK [1 ]
Weissman, MB [1 ]
机构：
[1] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
来源：
PHYSICAL REVIEW B | 2001年 / 63卷 / 13期
关键词：
D O I：
10.1103/PhysRevB.63.134107
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In three relaxer ferroelectrics strong low-field aging effects are found for the dielectric susceptibility. Different regimes, marked by different time dependence and by different stability under subsequent thermal cycles and field changes, are found in different materials and at different temperatures. One regime strongly resembles aging in spin glasses, but others do not.
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页数：10
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