New fatigue model based on thermionic field emission mechanism

被引：6

作者：

Tajiri, M ^{[1
]}

Nozawa, H ^{[1
]}

机构：

[1] Kyoto Univ, Grad Sch Energy Sci, Dept Energy Sci & Technol, Sakyo Ku, Kyoto 6068501, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2001年 / 40卷 / 9B期

关键词：

PZT; SBT; fatigue; pinning; thermionic field emission rate; impact ionization; energy dissipation;

D O I：

10.1143/JJAP.40.5590

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We investigated the mechanism of the fatigue phenomenon in ferroelectric thin films such as Pb(Zr, Ti)O-3 (PZT) and SrBi2Ta2O9 (SBT). The fatigue phenomenon in PZT was successfully explained by a new concept model introducing the effect of impact-ionization and energy distribution of trap levels to thermionic field emissions. This model can also explain the effect of applied voltage and temperature on the fatigue phenomenon. Moreover, we can simulate the fatigue characteristics in SBT by including the energy dissipation effect on the model for PZT. By introducing this result into an extrapolation method, the rewriting limit of ferroelectric thin films can be successfully predicted.

引用

页码：5590 / 5594

页数：5

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