Controlled modification of conducting polymer surfaces by atomic force microscope

被引：0
|
作者：
Zhou, L
Zhang, PC
Ho, PKC
Xu, GQ
Li, SFY
Chan, L
机构：
[1] NATL UNIV SINGAPORE, DEPT CHEM, SINGAPORE 117548, SINGAPORE
[2] CHARTERED SEMICOND MFG LTD, SINGAPORE 0511, SINGAPORE
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1996年 / 15卷 / 23期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：2080 / 2084
页数：5
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