Understanding the Surface Diffusion Processes during Magnetron Sputter-Deposition of Complex Oxide Mg-Al-O Thin Films

被引:19
作者
Georgieva, Violeta [1 ]
Voter, Arthur F. [2 ]
Bogaerts, Annemie [1 ]
机构
[1] Univ Antwerp, Dept Chem, Res Grp PLASMANT, B-2610 Antwerp, Belgium
[2] Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
关键词
SIMULATION; DYNAMICS;
D O I
10.1021/cg200318h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
It is known that film structure may change dramatically with the extent of surface diffusion during the film growth process. In the present work, surface diffusion, induced thermally or activated by energetic impacts, is investigated theoretically under conditions appropriate for magnetron sputter-deposition of Mg-Al-O thin films with varying stoichiometry. The distribution of surface diffusion energy barriers available to the system was determined for each stoichiometry, which allowed assessing in a qualitative way how much surface diffusion will take place on the time scale available between deposition events. The activation energy barriers increase with the Al concentration in the film, and therefore, the surface diffusion rates in the time frame of typical deposition rates drop, which can explain the decrease in crystallinity in the film structure and the transition to amorphous structure. The deposition process and the immediate surface diffusion enhanced by the energetic adatoms are simulated by means of a molecular dynamics model. The longer-time thermal surface diffusion and the energy landscape are studied by the temperature accelerated dynamics method, applied in an approximate way. The surface diffusion enhanced by the energetic impacts appears to be very important for the film structure in the low-temperature deposition regime.
引用
收藏
页码:2553 / 2558
页数:6
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