Analysis of microstructure changes and dynamic processes at rough surfaces using speckle correlation

被引：4

作者：

Fricke-Begemann, T ^{[1
]}

Beyrau, F ^{[1
]}

Gülker, G ^{[1
]}

Hinsch, KD ^{[1
]}

Jäschke, P ^{[1
]}

Wolff, K ^{[1
]}

机构：

[1] Univ Oldenburg, Dept Phys, D-26111 Oldenburg, Germany

来源：

SCATTERING AND SURFACE ROUGHNESS II | 1998年 / 3426卷

关键词：

speckle; correlation; surface processes; microstructure changes; corrosion;

D O I：

10.1117/12.328445

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The decorrelation of the characteristic speckle pattern, produced by the scattering of coherent light from a random rough surface, is used to monitor changes in the microtopography of the surface. In a basic optical setup minute alterations down to a few nanometers can be measured. To enlighten the basic relations between the speckle field decorrelation and the surface changes a theoretical model is developed, numerical calculations are carried out and comparisons with high resolution AFM measurements on two frozen states of a surface process are undertaken. Whereas the reproducibility of the AFM measurement turns out to be not precise enough to measure nanometer changes on a micrometer scale rough surface, the theoretical model is consistent with results gained from experimental variation of wavelenght and angle of illumination and a-priori knowledge about the surface. It is then used to obtain information about magnitude, time constants and statistical parameters of a corrosion process.

引用

页码：113 / 123

页数：11