Effects of La-dopant on Phase, Microstructure and Dielectric Properties of Bi4Ti3O12 Ceramics

被引：1
作者：
Sinprapa, Pasinee [1 ]
Watcharapasorn, Anucha [1 ]
Jiansirisomboon, Sukanda [1 ]
机构：
[1] Chiang Mai Univ, Dept Phys & Mat Sci, Fac Sci, Chiang Mai 50200, Thailand
来源：
FUNCTIONALIZED AND SENSING MATERIALS | 2010年 / 93-94卷
关键词：
BLT; Layered compound; X-ray diffraction; Microstructure; Dielectric properties; SUBSTITUTED BISMUTH TITANATE; FERROELECTRIC PROPERTIES; RIETVELD ANALYSIS; LANTHANUM; SM;
D O I：
10.4028/www.scientific.net/AMR.93-94.251
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Bi(4)La(x)Ti(3)O(12) (where x = 0, 0.25, 0.50, 0.75 and 1) powders and ceramics were prepared using conventional solid state reaction and sintering procedures. The calcination was carried out at 750 degrees C for 4 h and sintering was done at 1150 degrees C for 4 h. The density of all ceramics was found to be comparable regardless of La concentration. X-ray diffraction analysis showed that preferred orientation of ceramic grains was reduced with addition of La ions. This reduced preferred orientation was accompanied by a decrease in grain size. The temperature dependence of dielectric constant showed a decrease in T(c) with increasing La concentration.
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页码：251 / 254
页数：4
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