Carrier concentration dependence of critical fluctuation in La2-xSrxCuO4

被引：1
|
作者：
Ohashi, Takeyoshi
Kitano, Haruhisa
Maeda, Atsutaka
Tsukada, Ichiro
机构：
[1] Univ Tokyo, Meguro Ku, Tokyo 1538902, Japan
[2] Cent Res Inst Elect Power Ind, Tokyo 2018511, Japan
来源：
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2007年 / 460卷 / SPEC. ISS.期
基金：
日本学术振兴会;
关键词：
fluctuation; dynamic scaling; microwave conductivity; LSCO; cuprate superconductor;
D O I：
10.1016/j.physc.2007.03.271
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We investigated the superconducting fluctuation effects of overdoped La2-xSrxCuO4 (LSCO) film with x = 0.19 by the microwave conductivity measurement. Temperature and frequency dependences of the fluctuation-induced excess conductivity in the vicinity of T-c were analyzed using a dynamic scaling theory. We observed a two dimensional (21) critical behavior of the fluctuation. Together with our previous work, the spatial dimension of the fluctuation does change from 2D (for underdoped LSCO) to 3D (for nearly optimally doped LSCO), and then, to 2D (for overdoped LSCO) as the carrier concentration increases. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：906 / 907
页数：2
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