Real-time image segmentation for anomalies detection using SVM approximation

被引:1
作者
Bouillant, S [1 ]
Mitéran, J [1 ]
Paindavoine, M [1 ]
Bourennane, E [1 ]
Bourgeat, P [1 ]
机构
[1] Univ Bourgogne, CNRS, FRE, F-21078 Dijon, France
来源
SIXTH INTERNATIONAL CONFERENCE ON QUALITY CONTROL BY ARTIFICIAL VISION | 2003年 / 5132卷
关键词
image segmentation; SVM; Hyperrectangle; classification; flaw detection; real-time;
D O I
10.1117/12.515163
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this paper, we propose a method of implementation improvement of the decision rule of the support vector machine, applied to real-time image segmentation. We present very high speed decisions (approximately 10 ns per pixel) which can be useful for detection of anomalies on manufactured parts. We propose an original combination of classifiers allowing fast and robust classification applied to image segmentation. The SVM is used during a first step, preprocessing the training set and thus rejecting any ambiguities. The hyperrectangles-based learning algorithm is applied using the SVM classified training set. We show that the hyperrectangle method imitates the SVM method in terms of performances, for a lower cost of implementation using reconfigurable computing. We review the principles of the two classifiers: the Hyperrectangles-based method and the SVM and we present our combination method applied on image segmentation of an industrial part.
引用
收藏
页码:539 / 545
页数:7
相关论文
共 17 条
[1]  
[Anonymous], CIVILIZATION SEXES R
[2]  
BISHOP CM, 1995, NEURAL NETWORKS PATT, P110
[3]  
CHAPMAN K, 1996, XAPP054 XIL INC
[4]  
DUBUISSON B., 1990, DIAGNOSTIC RECONNAIS
[5]  
Duda R.O., 1973, PATTERN CLASSIFICATI, P230
[6]  
ENZLER R, 2000, LECT NOTES COMPUTER, V1896, P525
[7]   The roles of FPGA's in reprogrammable systems [J].
Hauck, S .
PROCEEDINGS OF THE IEEE, 1998, 86 (04) :615-638
[8]   Support vector machines [J].
Hearst, MA .
IEEE INTELLIGENT SYSTEMS & THEIR APPLICATIONS, 1998, 13 (04) :18-21
[9]  
Jonsson K., 1999, BMVC99. Proceedings of the 10th British Machine Vision Conference, P543
[10]   On combining classifiers [J].
Kittler, J ;
Hatef, M ;
Duin, RPW ;
Matas, J .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1998, 20 (03) :226-239