Thickness dependence of magnetic properties in La-Co substituted strontium hexaferrite films with perpendicular anisotropy

被引:0
作者
Hui, Yajuan [1 ,2 ]
Cheng, Weiming [1 ,2 ]
Yan, Peng [1 ,2 ]
Chen, Jincai [2 ]
Miao, Xiangshui [1 ,2 ,3 ]
机构
[1] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan 430074, Peoples R China
[2] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China
[3] Huazhong Univ Sci & Technol, Wuhan Natl High Magnet Field Ctr, Wuhan 430074, Peoples R China
基金
中国国家自然科学基金;
关键词
Thickness; Strontium hexaferrite; Perpendicular anisotropy; Coercivity; Preferred orientation; Magnetization reversal; THIN-FILMS; MICROSTRUCTURE; EVOLUTION;
D O I
10.1016/j.jmmm.2015.04.081
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The thickness dependence of magnetization reversal and coercivity behavior for La-Co substituted strontium hexaferrite (Sr-M) films was investigated. It is found that perpendicular anisotropy appears only when film thickness (t) is above 110 nm. With increasing t, perpendicular anisotropy energy (K-u perpendicular to) increases gradually to its maximum of 1.76 x 10(6) erg/cm(3) at t = 300 nm, but turns to decrease when t > 300 nm. Moreover, when t > 110 nm, those films exhibit domains pinning or Stoner-Wohlfarth reversal model, present large K-u perpendicular to values and a rapid increase in H-c perpendicular to. However, while t <= 110 nm, Sr-M films show nucleation model of magnetization reversal and perform low coercivity. The origin of the coercivity varying with thickness should be correlated with the grain size and preferred orientations in Sr-M films. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:56 / 60
页数:5
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