A logical explanation of structurally unfit X-ray diffraction peaks in nanoferroelectrics

被引：0

作者：

Dudhe, C. M. ^{[1
]}

Sakhare, B. K. ^{[2
]}

Panchbhai, S. S. ^{[3
]}

Khambadkar, S. J. ^{[1
]}

Dhoke, N. V. ^{[1
]}

Chaudhari, C. P. ^{[1
]}

Palikundwar, U. A. ^{[4
]}

机构：

[1] Inst Sci, Dept Phys, Nagpur 440001, Maharashtra, India

[2] SDSM Coll, Dept Phys, Palghat 401404, India

[3] Vidyabharti Coll, Dept Phys, Seloo 442104, India

[4] RTM Nagpur Univ, Dept Phys, Nagpur 440033, Maharashtra, India

来源：

BULLETIN OF MATERIALS SCIENCE | 2018年 / 41卷 / 01期

关键词：

X-ray diffraction; domains; ferroelectrics; nanoparticles; transmission electron microscopy; BARIUM-TITANATE; SIZE; NANOPARTICLES; POLARIZATION; NANODOMAINS;

D O I：

10.1007/s12034-017-1528-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the present paper we suggest the cause and solution of some unidentified X-ray diffraction (XRD) peaks in ferroelectric nanoparticles. Indeed, a relationship between the structurally unfit XRD peaks and domains in the ferroelectric nanoparticles is suggested. BaTiO3, PbTiO3 and Sr0.5Ba0.5Nb2O6 nanoparticles were used as trial samples. Diffraction of X-rays by domain grating was considered for the occurrence of unfit peaks. It was found that domain widths corresponding to some structurally unfit minor peaks of all three trail samples show good agreement to the values estimated from the transmission electron microscopy images. The study can be used to estimate the width of nanodomains (within 5-10 angstrom) in ferroelectric nanoparticles. Thus, the study seems to be highly important for the advancement of nanoferroelectricity.

引用

页数：8

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