Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films

被引：0

作者：

Maximova, O. A. ^{[1
,2
,3
]}

Kosyrev, N. N. ^{[1
,4
]}

Varnakov, S. N. ^{[1
,2
]}

Lyashchenko, S. A. ^{[1
,2
]}

Tarasov, I. A. ^{[1
,2
]}

Yakovlev, I. A. ^{[1
,2
]}

Maximova, O. M. ^{[3
]}

Shevtsov, D. V. ^{[1
,2
]}

Ovchinnikov, S. G. ^{[1
,2
,3
]}

机构：

[1] Kirensky Inst Phys, Krasnoyarsk 660036, Russia

[2] Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660014, Russia

[3] Siberian Fed Univ, Krasnoyarsk 660041, Russia

[4] Krasnoyarsk State Agrarian Univ, Achinsk Branch, Achinsk 662150, Russia

来源：

8TH JOINT EUROPEAN MAGNETIC SYMPOSIA (JEMS2016) | 2017年 / 903卷

基金：

俄罗斯基础研究基金会;

关键词：

D O I：

10.1088/1742-6596/903/1/012060

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this work we present the way of nanostructured films study by means of magneto-llipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.

引用

页数：3

共 7 条

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