Measurement of small displacement based on surface plasmon resonance heterodyne interferometry

被引:27
|
作者
Lin, Jiun-You [1 ]
Chen, Kun-Huang [2 ]
Chen, Jing-Heng [3 ]
机构
[1] Natl Changhua Univ Educ, Dept Mechatron Engn, Changhua 50074, Taiwan
[2] Feng Chia Univ, Dept Elect Engn, Taichung 40724, Taiwan
[3] Feng Chia Univ, Dept Photon, Taichung 40724, Taiwan
关键词
Small displacement; Surface plasmon resonance; Heterodyne interferometry; Common-path configuration; NONLINEARITY; SYSTEM; BEAM;
D O I
10.1016/j.optlaseng.2011.03.005
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper proposes an optical method for measuring small displacements using the surface plasmon resonance (SPR) heterodyne interferometry. A heterodyne light beam reflected by a mirror passes through a hemisphere glass and then enters into a surface plasmon resonance apparatus at the resonant angle. A small displacement of the mirror will introduce a phase-difference variation between p- and s-polarizations of the light emerging from the SPR apparatus. The phase-difference variation can be precisely measured with the heterodyne interferometric technique, and the associated displacement can be estimated. The feasibility of this method was verified by experiment, and the displacement measurement resolution of about 1.4 nm over a traveling range of 6 pm was achieved. Our method of measurement has the merits of both common-path interferometry and heterodyne interferometry. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:811 / 815
页数:5
相关论文
共 50 条
  • [11] Non-contact method for measuring solution concentration using surface plasmon resonance apparatus and heterodyne interferometry
    Chen, Kun-Huang
    Chen, Jing-Heng
    Kuo, Shou-Wei
    Kuo, Tsung-Ter
    Lai, Ming-Hung
    OPTICS COMMUNICATIONS, 2010, 283 (10) : 2182 - 2185
  • [12] Small displacement measurements based on total-internal-reflection heterodyne interferometry
    Chiu, MH
    Lin, JY
    Su, DC
    THREE-DIMENSIONAL IMAGING, OPTICAL METROLOGY, AND INSPECTION V, 1999, 3835 : 32 - 38
  • [13] Enhanced sensitivity to surface plasmon resonance phase in wavelength-modulated heterodyne interferometry
    Lee, Ju-Yi
    Mai, Li-Wei
    Hsu, Cheng-Chih
    Sung, Yuan-Yuan
    OPTICS COMMUNICATIONS, 2013, 289 : 28 - 32
  • [14] Measurement of small displacements with polarization properties of internal reflection and heterodyne interferometry
    Chen, Kun-Huang
    Chen, Jing-Heng
    Cheng, Ching-Hwa
    Yang, Tsung-Han
    OPTICAL ENGINEERING, 2009, 48 (04)
  • [15] Development of an Angular Displacement Measurement by Birefringence Heterodyne Interferometry
    Chen, Lin-Yu
    Lee, Ju-Yi
    Chang, Hung-Sheng
    Yang, Yang
    SMART SCIENCE, 2015, 3 (04) : 188 - 192
  • [16] Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution
    Lee, Ju-Yi
    Chen, Hui-Yi
    Hsu, Cheng-Chih
    Wu, Chyan-Chyi
    SENSORS AND ACTUATORS A-PHYSICAL, 2007, 137 (01) : 185 - 191
  • [17] High-angular-sensitivity total-internal-reflection heterodyne interferometry for small displacement measurements
    Lin, Jiun-You
    Lee, Xuan-Wei
    Hsieh, Meng-Chang
    Chang, Chia-Ou
    SENSORS AND ACTUATORS A-PHYSICAL, 2018, 277 : 163 - 168
  • [18] Spectral interferometry-based surface plasmon resonance sensor
    Hlubina, P.
    Duliakova, M.
    Kadulova, M.
    Ciprian, D.
    OPTICS COMMUNICATIONS, 2015, 354 : 240 - 245
  • [19] Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry
    Lee, Ju-Yi
    Shih, Hsueh-Ching
    Hong, Cyun-Tai
    Chou, Teng Ko
    OPTICS COMMUNICATIONS, 2007, 276 (02) : 283 - 287
  • [20] Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry
    Hsieh, Meng-Chang
    Lin, Jiun-You
    Chang, Chia-Ou
    CHINESE OPTICS LETTERS, 2016, 14 (08)