Effect of conformal roughness on ferromagnetic resonance linewidth in thin Permalloy films

被引：6

作者：

Maranville, BB ^{[1
]}

Mallett, J ^{[1
]}

Moffat, TP ^{[1
]}

McMichael, RD ^{[1
]}

Chen, AP ^{[1
]}

Egelhoff, WF ^{[1
]}

机构：

[1] NIST, Div Met, Gaithersburg, MD 20899 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2005年 / 97卷 / 10期

关键词：

D O I：

10.1063/1.1860271

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The ferromagnetic resonance linewidth is a result of both intrinsic damping and contributions from inhomogeneities, which in thin films can be dominated by the roughness. Microstructural measurements and magnetization dynamics are reported here for 50-nm films of Permalloy deposited on substrates with controlled roughness. Ferromagnetic resonance measurements reveal a strong linewidth broadening that peaks when the magnetization is approximately 30 degrees from the in-plane direction. These results are compared with a recently developed two-magnon theory of resonance broadening due to inhomogeneous demagnetizing fields in a rough film.

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页数：3

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