Electronic structure of the interface of GaAs(100) with MgO overlayer grown by thermal evaporation of Mg in O2 under UHV

被引:3
作者
Xu, FQ [1 ]
Pan, HB [1 ]
Zhang, WH [1 ]
Wang, GD [1 ]
Li, ZM [1 ]
Xu, PS [1 ]
机构
[1] Univ Sci & Technol China, Natl Synchroton Radiat Lab, Hefei 230029, Peoples R China
关键词
photoemission; MgO; GaAs(100); surface and interface;
D O I
10.1016/j.elspec.2005.01.240
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Thermal evaporation of Mg in oxygen atmosphere under UHV condition was conducted to fabricate ultrathin MgO film over GaAs(1 0 0) substrate at room temperature (T-R). Synchrotron Radiation Photoemission Spectroscopy (SRPES) results show that very weak interaction and interdiffusion exist between the oxide overlayer and substrate indicating that the reaction between Mg and O-2 is much more active than that between Mg with GaAs. The growth of MgO overlayer may be expected in such a mode that Mg reacts with O-2 in gas phase or near surface to form MgO, followed by the deposition of MgO over GaAs(1 0 0). (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:385 / 388
页数:4
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