Photoluminescence enhancement through silicon implantation on SRO-LPCVD films

被引:15
作者
Morales-Sanchez, A. [1 ]
Leyva, K. M. [1 ]
Aceves, M. [1 ]
Barreto, J. [2 ]
Dominguez, C. [2 ]
Luna-Lopez, J. A. [3 ]
Carrillo, J. [3 ]
Pedraza, J. [1 ]
机构
[1] INAOE, Dept Elect, Puebla 72000, Mexico
[2] CSIC, Inst Microelect Barcelona, IMB CNM, Barcelona, Spain
[3] CIDS BUAP, Puebla 72000, Mexico
来源
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS | 2010年 / 174卷 / 1-3期
关键词
Silicon-rich oxide; Silicon-nanoparticles; Photoluminescence; Silicon implanted SRO; OXIDE; ELECTROLUMINESCENCE; NANOCRYSTALS;
D O I
10.1016/j.mseb.2010.03.031
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Photoluminescence (PL) properties of thin and thick silicon-rich oxide (SRO) and silicon implanted SRO (SI-SRO) films with different silicon excess fabricated by low pressure chemical vapor deposition (LPCVD) were studied. The effects of the annealing temperature and silicon implantation on the PL were also studied. Maximum luminescence intensity was observed with an annealing temperature of 1150 and 1100 degrees C for thin and thick SRO films, respectively. The PL intensity is strongly enhanced when SRO films are implanted with silicon, especially for thin SRO films. Thin SI-SRO films emit up to six times more than non-implanted films, meanwhile the PL in thick SI-SRO films is only improved less than two times. Therefore, thin SI-SRO films are an interesting alternative for applications such as the fabrication of efficient Si-nps based LEDs. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:119 / 122
页数:4
相关论文
共 18 条
[1]   Pulsed electroluminescence in silicon nanocrystals-based devices fabricated by PECVD [J].
Barreto, Jorge ;
Peralvarez, Mariano ;
Antonio Rodriguez, Jose ;
Morales, Alfredo ;
Riera, Montse ;
Lopez, Manel ;
Garrido, Blas ;
Lechuga, Laura ;
Dominguez, Carlos .
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2007, 38 (1-2) :193-196
[2]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[3]   LIGHT-INDUCED DEGRADATION ON POROUS SILICON [J].
CHANG, IM ;
PAN, SC ;
CHEN, YF .
PHYSICAL REVIEW B, 1993, 48 (12) :8747-8750
[4]   ELECTROLUMINESCENCE STUDIES IN SILICON DIOXIDE FILMS CONTAINING TINY SILICON ISLANDS [J].
DIMARIA, DJ ;
KIRTLEY, JR ;
PAKULIS, EJ ;
DONG, DW ;
KUAN, TS ;
PESAVENTO, FL ;
THEIS, TN ;
CUTRO, JA ;
BRORSON, SD .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (02) :401-416
[5]  
FLORES F, 2005, SUPERFICIES VACIO, V18, P7
[6]   Formation and evolution of luminescent Si nanoclusters produced by thermal annealing of SiOx films [J].
Iacona, F ;
Bongiorno, C ;
Spinella, C ;
Boninelli, S ;
Priolo, F .
JOURNAL OF APPLIED PHYSICS, 2004, 95 (07) :3723-3732
[7]   Influence of surface states on the photoluminescence from silicon nanostructures [J].
Islam, MN ;
Kumar, S .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (03) :1753-1759
[8]   Controlling the formation of luminescent Si nanocrystals in plasma-enhanced chemical vapor deposited silicon-rich silicon oxide through ion irradiation [J].
Kim, TG ;
Whang, CN ;
Sun, Y ;
Seo, SY ;
Shin, JH ;
Song, JH .
JOURNAL OF APPLIED PHYSICS, 2002, 91 (05) :3236-3242
[9]   Comparative study of Si precipitation in silicon-rich oxide films [J].
Lebour, Y. ;
Pellegrino, P. ;
Hernandez, S. ;
Martinez, A. ;
Jordana, E. ;
Fedeli, J. -M. ;
Garrido, B. .
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2009, 41 (06) :990-993
[10]   Defect-enhanced visible electroluminescence of multi-energv silicon-implanted silicon dioxide film [J].
Lin, CJ ;
Lin, GR .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2005, 41 (03) :441-447