Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometry

被引:0
|
作者
Azzam, R. M. A. [1 ]
机构
[1] Univ New Orleans, Dept Elect Engn, New Orleans, LA 70148 USA
关键词
Ellipsometry; Surface roughness; Optical tunneling; Air gap thickness measurement; Frustrated total internal reflection; INDEX THIN-FILM; PHASE-SHIFTS; SCATTERING;
D O I
10.1016/j.tsf.2013.11.139
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Optical tunneling of collimated monochromatic light of wavelength lambda through an air gap of thickness d(x, y) between two stress-free transparent prisms of the same refractive index N at an angle of incidence phi > the critical angle is accompanied by spatially variable transmission differential phase shift Delta(t)(x, y) that can be measured by a straight-through imaging ellipsometer with suitable polarizing and analyzing optics and two-dimensional array detector. Operation under the condition of equal tunneling for the p and s polarizations at phi(e) = arcsin root 2/(N-2 +1) leads to an analytical solution for d(x, y) in terms of Delta(t)(x, y). (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:666 / 668
页数:3
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