Multiple optical centers in Eu-implanted AlN nanowires for solid-state lighting applications

被引:8
作者
Cardoso, J. [1 ,2 ]
Ben Sedrine, N. [1 ,2 ]
Alves, A. [1 ,2 ]
Martins, M. A. [3 ,4 ]
Belloeil, M. [5 ]
Daudin, B. [5 ]
Faye, D. Nd. [6 ]
Alves, E. [6 ]
Lorenz, K. [6 ,7 ]
Neves, A. J. [1 ,2 ]
Correia, M. R. [1 ,2 ]
Monteiro, T. [1 ,2 ]
机构
[1] Univ Aveiro, Dept Fis, Campus Univ Santiago, P-3810193 Aveiro, Portugal
[2] Univ Aveiro, I3N, Campus Univ Santiago, P-3810193 Aveiro, Portugal
[3] Univ Aveiro, Dept Fis, P-3810193 Aveiro, Portugal
[4] Univ Aveiro, CICECO, P-3810193 Aveiro, Portugal
[5] Univ Grenoble Alpes, CEA CNRS Grp Nanophys & Semicond, F-38000 Grenoble, France
[6] IPFN, Inst Super Tecn, Campus Tecnol & Nucl,Estr Nacl 10, P-2695066 Bobadela Lrs, Portugal
[7] Inst Engn Sistemas Comp Microsyst & Nanotechnol I, Rua Alves Redol, P-1000029 Lisbon, Portugal
关键词
GAN NANOWIRES; LUMINESCENCE; SEMICONDUCTORS; TEMPERATURE; INTENSITIES; TB;
D O I
10.1063/1.5048772
中图分类号
O59 [应用物理学];
学科分类号
摘要
A detailed spectroscopic analysis of Eu3+ implanted and annealed AlN nanowires (NWs) grown by plasma-assisted molecular beam epitaxy is presented by using micro-Raman, temperature-dependent steady-state photoluminescence, and time-resolved photoluminescence. Two different annealing temperatures (1000 degrees C and 1200 degrees C) were used. Such annealing conditions achieved a recovery of the original AlN crystalline structure as confirmed by Raman analysis. For both samples, the red Eu3+ intra-4f(6) luminescence was demonstrated, where the D-5(0) -> F-7(2) transition at 624 nm is the most intense. Two well-resolved Eu optically active centers were observed in the present AlN NWs and designated as Eu1 and Eu2, due to their similar spectral shape when compared to those observed in GaN layers [Bodiou et al., Opt. Mater. 28, 780 (2006); Roqan et al., Phys. Rev. B 81, 085209 (2010)]. Their behavior was found to depend on the annealing temperature. Photoluminescence studies reveal that at 14K, Eu2 is dominant for the lower annealing temperature, while Eu1 is dominant for the highest annealing temperature. Moreover, at room temperature, Eu1 center was found to be the dominant for both samples. Indeed, the luminescence intensity of the D-5(0) -> F-7(2) transition exhibits a lower thermal quenching for the samples annealed at the highest temperature (similar to 80% for the sample annealed at 1200 degrees C and similar to 50% for the sample annealed at 1000 degrees C) boosting their potential use as efficient red emitters. Published by AIP Publishing.
引用
收藏
页数:5
相关论文
共 35 条
[1]   Quantum Dot-Like Behavior of Compositional Fluctuations in AIGaN Nanowires [J].
Belloeil, M. ;
Gayral, B. ;
Daudin, B. .
NANO LETTERS, 2016, 16 (02) :960-966
[2]   Optical investigations of europium ion implanted in nitride-based diode structures [J].
Ben Sedrine, N. ;
Rodrigues, J. ;
Cardoso, J. ;
Nd. Faye, D. ;
Fialho, M. ;
Magalhaes, S. ;
Martins, A. F. ;
Neves, A. J. ;
Alves, E. ;
Bockowski, M. ;
Hoffmann, V. ;
Weyers, M. ;
Lorenz, K. ;
Correia, M. R. ;
Monteiro, T. .
SURFACE & COATINGS TECHNOLOGY, 2018, 355 :40-44
[3]   Interpretation of europium(III) spectra [J].
Binnemans, Koen .
COORDINATION CHEMISTRY REVIEWS, 2015, 295 :1-45
[4]   Effect of annealing temperature on luminescence in Eu implanted GaN [J].
Bodiou, L ;
Oussif, A ;
Braud, A ;
Doualan, JL ;
Moncorgé, R ;
Lorenz, K ;
Alves, E .
OPTICAL MATERIALS, 2006, 28 (6-7) :780-784
[5]   Optically active centers in Eu implanted, Eu in situ doped GaN, and Eu doped GaN quantum dots [J].
Bodiou, L. ;
Braud, A. ;
Doualan, J. -L. ;
Moncorge, R. ;
Park, J. H. ;
Munasinghe, C. ;
Steckl, A. J. ;
Lorenz, K. ;
Alves, E. ;
Daudin, B. .
JOURNAL OF APPLIED PHYSICS, 2009, 105 (04)
[6]   Phonon dispersion and Raman scattering in hexagonal GaN and AlN [J].
Davydov, VY ;
Kitaev, YE ;
Goncharuk, IN ;
Smirnov, AN ;
Graul, J ;
Semchinova, O ;
Uffmann, D ;
Smirnov, MB ;
Mirgorodsky, AP ;
Evarestov, RA .
PHYSICAL REVIEW B, 1998, 58 (19) :12899-12907
[7]   LUMINESCENCE OF ERBIUM IMPLANTED IN VARIOUS SEMICONDUCTORS - IV-MATERIALS, III-V-MATERIALS AND II-VI MATERIALS [J].
FAVENNEC, PN ;
LHARIDON, H ;
SALVI, M ;
MOUTONNET, D ;
LEGUILLOU, Y .
ELECTRONICS LETTERS, 1989, 25 (11) :718-719
[8]   Study of damage formation and annealing of implanted III-nitride semiconductors for optoelectronic devices [J].
Faye, D. Nd. ;
Fialho, M. ;
Magalhaes, S. ;
Alves, E. ;
Ben Sedrine, N. ;
Rodrigues, J. ;
Correia, M. R. ;
Monteiro, T. ;
Bockowski, M. ;
Hoffmann, V. ;
Weyers, M. ;
Lorenz, K. .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2016, 379 :251-254
[9]   Effect of AlN content on the lattice site location of terbium ions in AlxGa1-xN compounds [J].
Fialho, M. ;
Rodrigues, J. ;
Magalhaes, S. ;
Correia, M. R. ;
Monteiro, T. ;
Lorenz, K. ;
Alves, E. .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2016, 31 (03)
[10]   Spectroscopic analysis of Eu3+ in single-crystal hexagonal phase AlN [J].
Gruber, John B. ;
Vetter, Ulrich ;
Taniguchi, Takashi ;
Burdick, Gary W. ;
Hofsaess, Hans ;
Chandra, Sreerenjini ;
Sardar, Dhiraj K. .
JOURNAL OF APPLIED PHYSICS, 2011, 110 (02)