A high resolution electron beam profile monitor

被引：0

作者：

Graves, WS ^{[1
]}

Johnson, ED ^{[1
]}

O'Shea, PG ^{[1
]}

机构：

[1] Brookhaven Natl Lab, NSLS, Upton, NY 11973 USA

来源：

PROCEEDINGS OF THE 1997 PARTICLE ACCELERATOR CONFERENCE, VOLS 1-3: PLENARY AND SPECIAL SESSIONS ACCELERATORS AND STORAGE RINGS - BEAM DYNAMICS, INSTRUMENTATION, AND CONTROLS | 1998年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the tranverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest.

引用

页码：1993 / 1995

页数：3