Experimental verification of electro-refractive phase modulation in graphene

被引：96

作者：

Mohsin, Muhammad ^{[1
]}

Neumaier, Daniel ^{[1
]}

Schall, Daniel ^{[1
]}

Otto, Martin ^{[1
]}

Matheisen, Christopher ^{[1
]}

Giesecke, Anna Lena ^{[1
]}

Sagade, Abhay A. ^{[1
]}

Kurz, Heinrich ^{[1
]}

机构：

[1] Appl Micro & Optoelect AMO GmbH, Adv Microelect Ctr Aachen AMICA, D-52074 Aachen, Germany

来源：

SCIENTIFIC REPORTS | 2015年 / 5卷

关键词：

HIGH-SPEED; FILMS; SINGLE;

D O I：

10.1038/srep10967

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Graphene has been considered as a promising material for opto-electronic devices, because of its tunable and wideband optical properties. In this work, we demonstrate electro-refractive phase modulation in graphene at wavelengths from 1530 to 1570 nm. By integrating a gated graphene layer in a silicon-waveguide based Mach-Zehnder interferometer, the key parameters of a phase modulator like change in effective refractive index, insertion loss and absorption change are extracted. These experimentally obtained values are well reproduced by simulations and design guidelines are provided to make graphene devices competitive to contemporary silicon based phase modulators for on-chip applications.

引用

页数：7

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