Diffuse wall structure and narrow mesopores in highly crystalline MCM-41 materials studied by X-ray diffraction

被引：101

作者：

Edler, KJ

Reynolds, PA

White, JW

Cookson, D

机构：

[1] AUSTRALIAN NATL UNIV,RES SCH CHEM,CANBERRA,ACT 0200,AUSTRALIA

[2] AUSTRALIAN NATL BEAMLINE FACIL,PHOTON FACTORY,TSUKUBA,IBARAKI,JAPAN

来源：

JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS | 1997年 / 93卷 / 01期

关键词：

D O I：

10.1039/a605676h

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Synchrotron X-ray diffraction patterns for highly crystalline MCM-41 a mesoporous silicate molecular sieve are presented. The form factor observed in seven orders of diffraction is used to show the existence of a two-layer wall structure, with a narrower mesopore than previously assumed, and much void space in the walls.

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页码：199 / 202

页数：4

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