Diffuse wall structure and narrow mesopores in highly crystalline MCM-41 materials studied by X-ray diffraction

被引:101
作者
Edler, KJ
Reynolds, PA
White, JW
Cookson, D
机构
[1] AUSTRALIAN NATL UNIV,RES SCH CHEM,CANBERRA,ACT 0200,AUSTRALIA
[2] AUSTRALIAN NATL BEAMLINE FACIL,PHOTON FACTORY,TSUKUBA,IBARAKI,JAPAN
来源
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS | 1997年 / 93卷 / 01期
关键词
D O I
10.1039/a605676h
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Synchrotron X-ray diffraction patterns for highly crystalline MCM-41 a mesoporous silicate molecular sieve are presented. The form factor observed in seven orders of diffraction is used to show the existence of a two-layer wall structure, with a narrower mesopore than previously assumed, and much void space in the walls.
引用
收藏
页码:199 / 202
页数:4
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