Wave-optical considerations in photolithography

被引:0
|
作者
Wong, AK [1 ]
Pierrat, C [1 ]
机构
[1] Fortis Syst Inc, Santa Clara, CA 95051 USA
来源
WAVE-OPTICAL SYSTEMS ENGINEERING II | 2003年 / 5182卷
关键词
photolithography; wave-optical effects; polarization effects; resolution enhancement techniques;
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Wave-optical effects are becoming more pronounced as optical lithography is pushed towards its limit. Photomask topography scattering and wafer polarization effects caused by differences in coupling between transverse electric and transverse magnetic waves degrade image quality. But polarization may provide an extra dimension that allows lithographers to devise simple solutions to otherwise difficult problems such as phase assignment.
引用
收藏
页码:63 / 72
页数:10
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