Deformation behavior and plastic instabilities of ultrafine-grained titanium

被引:436
作者
Jia, D [1 ]
Wang, YM
Ramesh, KT
Ma, E
Zhu, YT
Valiev, RZ
机构
[1] Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA
[2] Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA
[3] Univ Calif Los Alamos Natl Lab, Div Mat Sci & Technol, Los Alamos, NM 87545 USA
[4] Ufa State Aviat Tech Univ, Inst Phys Adv Mat, Ufa 450000, Russia
关键词
D O I
10.1063/1.1384000
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ultrafine-grained (UFG) Ti samples have been prepared using equal channel angular pressing followed by cold rolling and annealing. The deformation behavior of these materials, including strain hardening, strain rate dependence of flow stress, deformation/failure mode, and tensile necking instability, have been systematically characterized. The findings are compared with those for conventional coarse-grained Ti and used to explain the limited tensile ductility observed so far for UFG or nanocrystalline metals. (C) 2001 American Institute of Physics.
引用
收藏
页码:611 / 613
页数:3
相关论文
共 18 条
  • [1] Bai Y., 1992, Adiabatic Shear Localization: Occurrence, Theories and Applications, P1
  • [2] NANOCRYSTALLINE INTERMETALLIC COMPOUNDS - AN APPROACH TO DUCTILITY
    BOHN, R
    HAUBOLD, T
    BIRRINGER, R
    GLEITER, H
    [J]. SCRIPTA METALLURGICA ET MATERIALIA, 1991, 25 (04): : 811 - 816
  • [3] The high-strain-rate response of alpha-titanium: Experiments, deformation mechanisms and modeling
    Chichili, DR
    Ramesh, KT
    Hemker, KJ
    [J]. ACTA MATERIALIA, 1998, 46 (03) : 1025 - 1043
  • [4] EASTMAN JA, 1997, CHEM PHYSICS NANOSTR
  • [5] Folansbee P.S., 1985, ASM HDB AM SOC METAL, V8, P198
  • [6] THEORY OF TENSILE TEST
    HART, EW
    [J]. ACTA METALLURGICA, 1967, 15 (02): : 351 - &
  • [7] Jia D., 2000, SCRIPTA MATER, V42, P73
  • [8] JONES RJ, 1968, T METALL SOC AIME, V245, P779
  • [9] Ductility of nanostructured materials
    Koch, CC
    Morris, DG
    Lu, K
    Inoue, A
    [J]. MRS BULLETIN, 1999, 24 (02) : 54 - 58
  • [10] KOCH CC, IN PRESS J NANOSCIEN