Multivariate statistical analysis of non-mass-selected ToF-SIMS data

被引:13
作者
Smentkowski, V. S. [1 ]
Ostrowski, S. G. [1 ]
Kollmer, F. [2 ]
Schnieders, A. [3 ]
Keenan, M. R. [4 ]
Ohlhausen, J. A. [4 ]
Kotula, P. G. [4 ]
机构
[1] Global Res, Gen Elect, Niskayuna, NY 12309 USA
[2] ION TOF GmbH, Munster, Germany
[3] TASCON USA Inc, Chestnut Ridge, NY 10977 USA
[4] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
ToF-SIMS; multivariate statistical analysis; chemometrics; LMIG; cluster;
D O I
10.1002/sia.2862
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Cluster LMIGs are now regarded as the standard primary ion guns on time-of-flight secondary ion mass spectrometers (ToF-SIMS). The ToF-SIMS analyst typically selects a bombarding species (cluster size and charge) to be used for material analysis. Using standard data collection protocols where the analyst uses only a single primary bombarding species, only a fraction of the ion-beam current generated by the LMIG is used. In this work, we demonstrate for the first time that it is possible to perform ToF-SIMS analysis when all of the primary ion intensity (clusters) are used; we refer to this new data analysis mode as non-mass-selected (NMS) analysis. Since each of the bombarding species has a different mass-to-charge ratio, they strike the sample at different times, and as a result, each of the bombarding species generates a spectrum. The resulting NMS ToF-SIMS spectrum contains contributions from each of the bombarding species that are shifted in time. NMS spectra are incredibly complicated and would be difficult, if not impossible, to analyze using univariate methodology. We will demonstrate that automated multivariate statistical analysis (MVSA) tools are capable of rapidly converting the complicated NMS data sets into a handful of chemical components (represented by both spectra and images) that are easier to interpret since each component spectrum represents a unique and simpler chemistry. Copyright (C) 2008 John Wiley & Sons, Ltd.
引用
收藏
页码:1176 / 1182
页数:7
相关论文
共 17 条
[1]  
BRYAN S, 2005, 18 ANN SIMS WORKSH H
[2]   Polyatomic primary ion bombardment of organic materials: experiences in routine analysis [J].
Hagenhoff, B ;
Pfitzer, K ;
Tallarek, E ;
Kock, R ;
Kersting, R .
APPLIED SURFACE SCIENCE, 2004, 231 :196-200
[3]  
Keenan M. R., 2007, U.S. Patent, Patent No. [7,283,684 B1, 7283684]
[4]   Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images [J].
Keenan, MR ;
Kotula, PG .
SURFACE AND INTERFACE ANALYSIS, 2004, 36 (03) :203-212
[5]  
KEENAN MR, 2007, TECHNIQUES APPL HYPE
[6]   Cluster primary ion bombardment of organic materials [J].
Kollmer, F .
APPLIED SURFACE SCIENCE, 2004, 231 :153-158
[7]   Automated analysis of SEM X-ray spectral images: A powerful new microanalysis tool [J].
Kotula, PG ;
Keenan, MR ;
Michael, JR .
MICROSCOPY AND MICROANALYSIS, 2003, 9 (01) :1-17
[8]  
KOTULA PG, 2000, MICROSC MICROANAL S2, V6, P1052
[9]   Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and cells without labeling [J].
Lee, Tae Geol ;
Shon, Hyun Kyong ;
Lee, Kyung-Bok ;
Kim, Jinmo ;
Choi, Insung S. ;
Moon, Dae Won .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2006, 24 (04) :1203-1207
[10]  
NIEHUIS E, 1997, Patent No. 5633495