Shunt current loss of the vanadium redox flow battery

被引:82
作者
Xing, Feng [1 ]
Zhang, Huamin [1 ]
Ma, Xiangkun [1 ]
机构
[1] Chinese Acad Sci, Dalian Inst Chem Phys, Div Adv Energy Storage Batteries & Technol, Dalian 116023, Peoples R China
关键词
Shunt current loss; Vanadium redox flow battery; Circuit analog method; CELL; STACKS;
D O I
10.1016/j.jpowsour.2011.08.033
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The shunt current loss is one of main factors to affect the performance of the vanadium redox flow battery, which will shorten the cycle life and decrease the energy transfer efficiency. In this paper, a stack-level model based on the circuit analog method is proposed to research the shunt current loss of the vanadium redox flow battery, in which the SOC (state of charge) of electrolyte is introduced. The distribution of shunt current is described in detail. The sensitive analysis of shunt current is reported. The shunt current loss in charge/discharge cycle is predicted with the given experimental data. The effect of charge/discharge pattern on the shunt current loss is studied. The result shows that the reduction of the number of single cells in series, the decrease of the resistances of manifold and channel and the increase of the power of single cell will be the further development for the VRFB stack. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:10753 / 10757
页数:5
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