AlGaN-based solar-blind metal-semiconductor-metal photodetectors

被引:0
作者
Shao Huimin [1 ]
Zhang Shilin [1 ]
Xie Sheng [1 ]
Mao Luhong [1 ]
Guo WeiLian [1 ]
Li Xianjie
Yin Shunzheng [2 ]
Feng Zhihong [2 ]
Liu Bo [2 ]
机构
[1] Tianjin Univ, Sch Elect & Informat Engineer, Tianjin 300072, Peoples R China
[2] 13th Inst China Elect Technol Grp Corp, Shijiazhuang 050051, Peoples R China
来源
2011 INTERNATIONAL CONFERENCE OF ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC) | 2011年
基金
中国国家自然科学基金;
关键词
AlGaN; Solar-blind; Spectral Responsivity; Ultraviolet photodetector;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We reported on the fabrication and characterization of AlGaN metal-semiconductor-metal (MSM) photodetectors (PDs). AlGaN epitaxial material with an Al content of 0.6 were grown on sapphire substrates by metalorganic chemical vapor deposition (MOCVD). Schottky contacts were made with Ni/Pt/Au by the way of standard lift-off technique. We measured the performance of PDs. The cutoff wavelength is 276nm. Ultraviolet/visible contrast is about 3 orders of magnitude. The dark current is about 1nA at 1.5V bias and 1 mu A at 5.3V bias.
引用
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页数:2
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