Tomographic diffractive microscopy with a wavefront sensor

被引：16

作者：

Ruan, Y. ^{[1
]}

Bon, P. ^{[1
,2
]}

Mudry, E. ^{[1
]}

Maire, G. ^{[1
]}

Chaumet, P. C. ^{[1
]}

Giovannini, H. ^{[1
]}

Belkebir, K. ^{[1
]}

Talneau, A. ^{[3
]}

Wattellier, B. ^{[2
]}

Monneret, S. ^{[1
]}

Sentenac, A. ^{[1
]}

机构：

[1] Aix Marseille Univ, CNRS, Inst Fresnel, Ecole Cent Marseille, F-13013 Marseille, France

[2] PHASICS SA, F-91128 Palaiseau, France

[3] Lab Photon & Nanostruct, F-91460 Marcoussis, France

来源：

OPTICS LETTERS | 2012年 / 37卷 / 10期

关键词：

RESOLUTION;

D O I：

10.1364/OL.37.001631

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Tomographic diffractive microscopy is a recent imaging technique that reconstructs quantitatively the three-dimensional permittivity map of a sample with a resolution better than that of conventional wide-field microscopy. Its main drawbacks lie in the complexity of the setup and in the slowness of the image recording as both the amplitude and the phase of the field scattered by the sample need to be measured for hundreds of successive illumination angles. In this Letter, we show that, using a wavefront sensor, tomographic diffractive microscopy can be implemented easily on a conventional microscope. Moreover, the number of illuminations can be dramatically decreased if a constrained reconstruction algorithm is used to recover the sample map of permittivity. (C) 2012 Optical Society of America

引用

页码：1631 / 1633

页数：3

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