Optical Properties of CdS Thin Films

被引：31

作者：

Petrus, R. Yu ^{[1
]}

Ilchuk, H. A. ^{[1
]}

Kashuba, A., I ^{[1
,2
]}

Semkiv, I., V ^{[1
]}

Zmilovska, E. O. ^{[1
]}

Honchar, F. M. ^{[1
]}

机构：

[1] Lviv Polytech Natl Univ, UA-79013 Lvov, Ukraine

[2] Ivan Franko Natl Univ Lviv, UA-79005 Lvov, Ukraine

来源：

JOURNAL OF APPLIED SPECTROSCOPY | 2020年 / 87卷 / 01期

关键词：

thin film; refractive index; extinction coefficient; absorption coefficient; transmission spectrum; singleoscillator model; ELECTRICAL-PROPERTIES; CONSTANTS; THICKNESS; DEPOSITION; BEHAVIOR; GROWTH;

D O I：

10.1007/s10812-020-00959-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

We have studied the physical properties of CdS thin films obtained by high-frequency magnetron sputtering. We have determined the optical constants and the bandgap width for the studied fi lms (E-g = 2.39 eV). The spectral dependences of the refractive index, the absorption coefficient, and the extinction coefficient were obtained from the transmission spectra at room temperature. The optical parameters of the films were determined using a singleoscillator model, and also the Cauchy and Sellmeier equations.

引用

页码：35 / 40

页数：6

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