InGaAs resonant cavity light emitting diodes (RC LEDs)

被引:0
作者
Muszalski, J [1 ]
Bugajski, M [1 ]
Ochalski, T [1 ]
Mroziewicz, B [1 ]
Wrzesinska, H [1 ]
Górska, M [1 ]
Katcki, J [1 ]
机构
[1] Inst Electr Mat Technol, PL-02668 Warsaw, Poland
来源
LASER TECHNOLOGY VII: PROGRESS IN LASERS | 2003年 / 5230卷
关键词
resonant-cavity light emitting diodes; molecular beam epitaxy; photoluminescence;
D O I
10.1117/12.531927
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have developed resonant-cavity light emitting diodes (RC LED) with very good emission charactristics. RC LEDs proved to be more tolerant to the epitaxial growth parameters and device fabrication procedures. As relatively robust devices they are less sensitive to typical for VCSEL manufacturing challenges and seem to have great potential for applications. Comparing to classical LED the spectrum of RC LED is concentrated into a narrow line with less than 2 nm halfwidth. The RC LED spectrum is determined mainly by the cavity resonance; its width decreases with the increase of the cavity finesse and the intensity increase reflect the on axis cavity enhancement. Additional, favorable RC LED property is its emission characteristic directionality which depends on the tuning between QW emission and cavity resonance. We have optimized the series resistance of diodes. The best result have been obtained for digital alloy graded distributed Bragg reflector (DBR) interfaces. The MBE grown structures were tested extensively prior to the device fabrication. by reflectivity and photoluminescence. The assembled diodes were subjected to electrical and optical tests. Generally we have found very good correlation between the results of optical tests (PL maps) on as grown wafers and probe tests on final devices.
引用
收藏
页码:98 / 107
页数:10
相关论文
共 10 条
[1]   SPONTANEOUS EMISSION FACTOR OF A MICROCAVITY DBR SURFACE-EMITTING LASER [J].
BABA, T ;
HAMANO, T ;
KOYAMA, F ;
IGA, K .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1991, 27 (06) :1347-1358
[2]   Impact of planar microcavity effects on light extraction - Part I: Basic concepts and analytical trends [J].
Benisty, H ;
De Neve, H ;
Weisbuch, C .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1998, 34 (09) :1612-1631
[3]  
Klar PJ, 1998, PHYS STATUS SOLIDI A, V170, P145, DOI 10.1002/(SICI)1521-396X(199811)170:1<145::AID-PSSA145>3.0.CO
[4]  
2-0
[5]   Pyrometric interferometry during MBE growth of laser heterostructures [J].
Muszalski, J .
THIN SOLID FILMS, 2000, 367 (1-2) :299-301
[6]  
Ochalski T, 2000, NATO SCI S PRT 3 HI, V81, P201
[7]  
RATAJCZAK J, 2000, THIN SOLID FILMS, V367, P29
[8]   RESONANT CAVITY LIGHT-EMITTING DIODE [J].
SCHUBERT, EF ;
WANG, YH ;
CHO, AY ;
TU, LW ;
ZYDZIK, GJ .
APPLIED PHYSICS LETTERS, 1992, 60 (08) :921-923
[9]   INSITU GROWTH-RATE MEASUREMENTS DURING MOLECULAR-BEAM EPITAXY USING AN OPTICAL-PYROMETER [J].
SPRINGTHORPE, AJ ;
HUMPHREYS, TP ;
MAJEED, A ;
MOORE, WT .
APPLIED PHYSICS LETTERS, 1989, 55 (20) :2138-2140
[10]   RESONANT-CAVITY ENHANCED PHOTONIC DEVICES [J].
UNLU, MS ;
STRITE, S .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (02) :607-639