Thermal design and performance tests of a current limiter with a conduction cooled Nb3Sn screen

被引:8
作者
Sasaki, K [1 ]
Yamagata, A
Nii, A
Onishi, T
Shibuya, M
机构
[1] Hokkaido Univ, Sapporo, Hokkaido 0608628, Japan
[2] Super GM, Osaka, Japan
关键词
conduction cooled; fault current limiter;
D O I
10.1109/77.920274
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We examined the possibility of the practical use of a conduction cooled magnetic shield type fault current limiter from the view point of a thermal design. The thermal calculation was carried out with a small model using the Nb3Sn wire with low sc loss, Pie found that the temperature increase of the small model was insignificant. We also confirmed the current limiting operation in an experiment, The conceptual design and the thermal calculation of the conduction cooled fault current limiter for a distribution pou er system is also discussed in this report.
引用
收藏
页码:2114 / 2117
页数:4
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