Nanometer scale complementary silicon MOSFETs as detectors of terahertz and sub-terahertz radiation
被引:17
作者:
Stillman, W.
论文数: 0引用数: 0
h-index: 0
机构:
Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
IBM Microelectron, Fishkill, NY 12533 USARensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Stillman, W.
[1
,2
]
Guarin, F.
论文数: 0引用数: 0
h-index: 0
机构:
IBM Microelectron, Fishkill, NY 12533 USA
Russian Acad Sci, Ioffe Inst Russian Academy Sci, St Petersburg 194021, RussiaRensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Guarin, F.
[2
,3
]
Kachorovskii, V. Yu.
论文数: 0引用数: 0
h-index: 0
机构:
Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Russian Acad Sci, Ioffe Inst Russian Academy Sci, St Petersburg 194021, RussiaRensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Kachorovskii, V. Yu.
[1
,3
]
Pala, N.
论文数: 0引用数: 0
h-index: 0
机构:
Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Sensor Elect Technol Inc, Columbia, SC 29209 USARensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Pala, N.
[1
,4
]
Rumyantsev, S.
论文数: 0引用数: 0
h-index: 0
机构:
Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Russian Acad Sci, Ioffe Inst Russian Academy Sci, St Petersburg 194021, RussiaRensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Rumyantsev, S.
[1
,3
]
Shur, M. S.
论文数: 0引用数: 0
h-index: 0
机构:
Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USARensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Shur, M. S.
[1
]
Veksler, D.
论文数: 0引用数: 0
h-index: 0
机构:
Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USARensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
Veksler, D.
[1
]
机构:
[1] Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
[2] IBM Microelectron, Fishkill, NY 12533 USA
[3] Russian Acad Sci, Ioffe Inst Russian Academy Sci, St Petersburg 194021, Russia
[4] Sensor Elect Technol Inc, Columbia, SC 29209 USA
来源:
2007 IEEE SENSORS, VOLS 1-3
|
2007年
关键词:
D O I:
10.1109/ICSENS.2007.4388556
中图分类号:
TP18 [人工智能理论];
学科分类号:
081104 ;
0812 ;
0835 ;
1405 ;
摘要:
We demonstrate, for the first time, THz detection by Si CMOS, ie. by both p-channel and n-channel Si MOS devices. Previous work demonstrated that Si n-MOS devices detect THz and sub-THz radiation via the excitation of plasma waves in the device channel, with responsivity and Noise Equivalent Power on the order of commercial pyroelectric detectors but capable of operating at much greater speed as shown by a theory of temporal response predicting the maximum operating frequency. The CMOS responsivity is a strong increasing function of the drain current. Our experimental data and modeling results allow us to understand the effects of device geometry and bias on the Si CMOS THz detector performance.