Calculation of absolute intensities from X-ray imaging plates

被引:19
作者
Cookson, DJ [1 ]
机构
[1] Australian Nucl Sci Technol Org, Menai, NSW 2234, Australia
关键词
imaging plates; X-rays; images; statistics; intensity; calibration;
D O I
10.1107/S0909049598008334
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A numerical technique for deriving a conversion factor between the output pixel values from a scanned imaging plate and the actual incident X-ray photon flux is proposed. The technique requires no external calibration by independent detectors, but uses the statistical information inherent in the image. As a test case, this technique was applied to a Fuji BAS2000 imaging-plate scanner. The calculation showed that, at 1.2 Angstrom, 163 (8) photons pixel(-1) were required to give one output unit of pixel intensity on an image scanned 20 min after exposure. This conversion factor compared favourably with the independently measured conversion factor of 171.1 (5) photons pixel(-1) (output unit)(-1) obtained from a high-quantum-efficiency Ge detector.
引用
收藏
页码:1375 / 1382
页数:8
相关论文
共 16 条
[1]  
AKIMOV YK, 1965, SCINTILLATION COUNTE, P32
[3]   DESIGN AND PERFORMANCE OF AN IMAGING PLATE SYSTEM FOR X-RAY-DIFFRACTION STUDY [J].
AMEMIYA, Y ;
MATSUSHITA, T ;
NAKAGAWA, A ;
SATOW, Y ;
MIYAHARA, J ;
CHIKAWA, J .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1988, 266 (1-3) :645-653
[4]   IMAGING PLATES FOR USE WITH SYNCHROTRON-RADIATION [J].
AMEMIYA, Y .
JOURNAL OF SYNCHROTRON RADIATION, 1995, 2 :13-21
[5]   THE AUSTRALIAN DIFFRACTOMETER AT THE PHOTON FACTORY [J].
BARNEA, Z ;
CREAGH, DC ;
DAVIS, TJ ;
GARRETT, RF ;
JANKY, S ;
STEVENSON, AW ;
WILKINS, SW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :1069-1072
[6]   800X800 CHARGE-COUPLED DEVICE IMAGE SENSOR [J].
BLOUKE, MM ;
JANESICK, JR ;
HALL, JE ;
COWENS, MW ;
MAY, PJ .
OPTICAL ENGINEERING, 1983, 22 (05) :607-614
[7]   THE POINT-SPREAD FUNCTION OF X-RAY IMAGE-INTENSIFIERS CCD-CAMERA AND IMAGING-PLATE SYSTEMS IN CRYSTALLOGRAPHY - ASSESSMENT AND CONSEQUENCES FOR THE DYNAMIC-RANGE [J].
BOURGEOIS, D ;
MOY, JP ;
SVENSSON, SO ;
KVICK, A .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 :868-877
[8]   A STATISTICAL TECHNIQUE FOR CHARACTERIZING X-RAY POSITION-SENSITIVE DETECTORS [J].
DUFRESNE, E ;
BRUNING, R ;
SUTTON, M ;
RODRICKS, B ;
STEPHENSON, GB .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 364 (02) :380-393
[9]   EVALUATION OF AREA PHOTON DETECTORS BY A METHOD BASED ON DETECTIVE QUANTUM EFFICIENCY (DQE) [J].
GRUNER, SM ;
MILCH, JR ;
REYNOLDS, GT .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (01) :562-565
[10]   X-RAY-ENERGY DEPENDENCE AND UNIFORMITY OF AN IMAGING PLATE DETECTOR [J].
ITO, M ;
AMEMIYA, Y .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 310 (1-2) :369-372