Electromigration effects upon the Sn/Ni-7 wt % V interfacial reactions

The electromigration effects upon the Sn/Ni - 7 wt % V interfacial reactions are examined. A ternary T phase was formed in the Sn/Ni - 7 wt % V couple reacted at 200 C in the early stage. The reaction phases became T/Ni(3)Sn(4) and an interesting T/Ni(3)Sn(4)/T/Ni(3)Sn(4) alternating layer structure with longer reaction time. The passage of electric current of 500 A/cm(2) density through the couple alters the reaction rates and the phase progression time. At the interface with electrons flow concurrently to the diffusion of Sn atoms, the reaction rates are enhanced. (c) 2008 American Institute of Physics.