Electromagnetic Scattering from Dielectric Surfaces at Millimeter Wave and Terahertz Frequencies

被引:9
作者
DiGiovanni, D. A. [1 ]
Gatesman, A. J. [1 ]
Giles, R. H. [1 ]
Goyette, T. M. [1 ]
Nixon, W. E. [2 ]
机构
[1] Univ Massachusetts Lowell, Submillimeter Wave Technol Lab, Lowell, MA 01854 USA
[2] US Army Natl Ground Intellegence Ctr, Charlottesville, VA 22911 USA
来源
PASSIVE AND ACTIVE MILLIMETER-WAVE IMAGING XVIII | 2015年 / 9462卷
关键词
rough surface; scattering; terahertz; clutter; millimeter wave; W-BAND; BACKSCATTERING; MODEL;
D O I
10.1117/12.2179707
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the demand for larger bandwidths and faster data speeds, wireless communication systems are expanding into the millimeter wave and terahertz region of the electromagnetic spectrum. Successful transition to higher frequencies, particularly for systems located in urban or indoor environments, will require a thorough understanding of the reflection, transmission, absorption, and scattering of a wide variety of materials. For this study, the co-polarization and cross-polarization backscattering coefficients of several dielectrics were measured in compact radar ranges operating from 160 GHz to 1.55 THz. These structures consisted of dielectric disks with various rough surfaces. The backscattering measurements of these disks were compared as a function of polarization, incident angle, roughness, and frequency.
引用
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页数:10
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