Development of microbeam technology to expand applications at TIARA

被引:4
作者
Kamiya, T. [1 ]
Satoh, T. [1 ]
Koka, M. [1 ]
Kada, W. [2 ]
机构
[1] Japan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, Japan
[2] Gunma Univ, Fac Sci & Technol, Maebashi, Gunma, Japan
关键词
Microbeam; Ion beam analysis; Proton beam writing; Single ion hit; Diamond membrane detector; NUCLEAR MICROPROBE; ELEMENTAL ANALYSIS; MICROSCOPY; DIAMOND; SYSTEM; PARTICLES; GEOLOGY;
D O I
10.1016/j.nimb.2014.12.047
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Herein, we review the last half decade of progress in ion-microbeam technology and applications at the Takasaki Ion Accelerators for Advanced Radiation Applications facility. Materials were microanalysed with the light-ion-microbeam system by combining micro-particle-induced X-ray and gamma-ray emission, nuclear-reaction analysis and micro-ion-beam-induced luminescence to analyse elements, including light elements such as lithium, boron or fluoride, and also their chemical states. For microfabrication, we used particle-beam writing and techniques of maskless patterning to processes materials without etching. The goal was to develop optical, magnetic or other new types of microdevices with both light-ion and the heavy-ion microbeam systems. In addition, techniques were developed to monitor in real time every individual ion injection by using an efficient scintillator or a thin diamond particle detector in both heavy-ion and high-energy heavy-ion microbeam systems. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:4 / 7
页数:4
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