Development of microbeam technology to expand applications at TIARA

被引:4
作者
Kamiya, T. [1 ]
Satoh, T. [1 ]
Koka, M. [1 ]
Kada, W. [2 ]
机构
[1] Japan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, Japan
[2] Gunma Univ, Fac Sci & Technol, Maebashi, Gunma, Japan
关键词
Microbeam; Ion beam analysis; Proton beam writing; Single ion hit; Diamond membrane detector; NUCLEAR MICROPROBE; ELEMENTAL ANALYSIS; MICROSCOPY; DIAMOND; SYSTEM; PARTICLES; GEOLOGY;
D O I
10.1016/j.nimb.2014.12.047
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Herein, we review the last half decade of progress in ion-microbeam technology and applications at the Takasaki Ion Accelerators for Advanced Radiation Applications facility. Materials were microanalysed with the light-ion-microbeam system by combining micro-particle-induced X-ray and gamma-ray emission, nuclear-reaction analysis and micro-ion-beam-induced luminescence to analyse elements, including light elements such as lithium, boron or fluoride, and also their chemical states. For microfabrication, we used particle-beam writing and techniques of maskless patterning to processes materials without etching. The goal was to develop optical, magnetic or other new types of microdevices with both light-ion and the heavy-ion microbeam systems. In addition, techniques were developed to monitor in real time every individual ion injection by using an efficient scintillator or a thin diamond particle detector in both heavy-ion and high-energy heavy-ion microbeam systems. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:4 / 7
页数:4
相关论文
共 53 条
  • [1] Diamond membranes: applications for single ion detection using secondary electron emission
    Cholewa, M
    Kamiya, T
    Saint, A
    Prawer, S
    Legge, G
    Butler, JE
    Vestyck, DJ
    [J]. DIAMOND AND RELATED MATERIALS, 1998, 7 (2-5) : 510 - 512
  • [2] PRODUCTION AND USE OF A NUCLEAR MICROPROBE OF IONS AT MEV ENERGIES
    COOKSON, JA
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 165 (03): : 477 - 508
  • [3] APPLICATION OF A NUCLEAR MICROPROBE TO THE STUDY OF FISH OTOLITHS AND SCALES
    COOTE, GE
    GAULDIE, RW
    WEST, IF
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 54 (1-3) : 144 - 150
  • [4] No Evidence for DNA and Early Cytogenetic Damage in Bystander Cells after Heavy-Ion Microirradiation at Two Facilities
    Fournier, C.
    Barberet, P.
    Pouthier, T.
    Ritter, S.
    Fischer, B.
    Voss, K. O.
    Funayama, T.
    Hamada, N.
    Kobayashi, Y.
    Taucher-Scholz, G.
    [J]. RADIATION RESEARCH, 2009, 171 (05) : 530 - 540
  • [5] An ultra-thin diamond membrane as a transmission particle detector and vacuum window for external microbeams
    Grilj, V.
    Skukan, N.
    Pomorski, M.
    Kada, W.
    Iwamoto, N.
    Kamiya, T.
    Ohshima, T.
    Jaksic, M.
    [J]. APPLIED PHYSICS LETTERS, 2013, 103 (24)
  • [6] Irradiation of thin diamond detectors and radiation hardness tests using MeV protons
    Grilj, V.
    Skukan, N.
    Jaksic, M.
    Kada, W.
    Kamiya, T.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2013, 306 : 191 - 194
  • [7] Transient current mapping obtained from silicon photodiodes using focused ion microbeams with several hundreds of MeV
    Hirao, T.
    Onoda, S.
    Oikawa, M.
    Satoh, T.
    Kamiya, T.
    Ohshima, T.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (12-13) : 2216 - 2218
  • [8] Elemental analysis of cellular samples by in-air micro-PIXE
    Ishii, K
    Sugimoto, A
    Tanaka, A
    Satoh, T
    Matsuyama, S
    Yamazaki, H
    Akama, C
    Amartivan, T
    Endoh, H
    Oishi, Y
    Yuki, H
    Sugihara, S
    Satoh, M
    Kamiya, T
    Sakai, T
    Arakawa, K
    Saidoh, M
    Oikawa, S
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 181 : 448 - 453
  • [9] Defect-induced performance degradation of 4H-SiC Schottky barrier diode particle detectors
    Iwamoto, N.
    Johnson, B. C.
    Hoshino, N.
    Ito, M.
    Tsuchida, H.
    Kojima, K.
    Ohshima, T.
    [J]. JOURNAL OF APPLIED PHYSICS, 2013, 113 (14)
  • [10] JAKSIC M, 1993, NUCL INSTRUM METH B, V77, P49