Development of microbeam technology to expand applications at TIARA
被引:4
作者:
Kamiya, T.
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h-index: 0
机构:
Japan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, JapanJapan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, Japan
Kamiya, T.
[1
]
Satoh, T.
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机构:
Japan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, JapanJapan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, Japan
Satoh, T.
[1
]
Koka, M.
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机构:
Japan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, JapanJapan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, Japan
Koka, M.
[1
]
Kada, W.
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机构:
Gunma Univ, Fac Sci & Technol, Maebashi, Gunma, JapanJapan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, Japan
Kada, W.
[2
]
机构:
[1] Japan Atom Energy Agcy, Takasaki Adv Radiat Res Inst, Tokai, Ibaraki, Japan
[2] Gunma Univ, Fac Sci & Technol, Maebashi, Gunma, Japan
Microbeam;
Ion beam analysis;
Proton beam writing;
Single ion hit;
Diamond membrane detector;
NUCLEAR MICROPROBE;
ELEMENTAL ANALYSIS;
MICROSCOPY;
DIAMOND;
SYSTEM;
PARTICLES;
GEOLOGY;
D O I:
10.1016/j.nimb.2014.12.047
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
Herein, we review the last half decade of progress in ion-microbeam technology and applications at the Takasaki Ion Accelerators for Advanced Radiation Applications facility. Materials were microanalysed with the light-ion-microbeam system by combining micro-particle-induced X-ray and gamma-ray emission, nuclear-reaction analysis and micro-ion-beam-induced luminescence to analyse elements, including light elements such as lithium, boron or fluoride, and also their chemical states. For microfabrication, we used particle-beam writing and techniques of maskless patterning to processes materials without etching. The goal was to develop optical, magnetic or other new types of microdevices with both light-ion and the heavy-ion microbeam systems. In addition, techniques were developed to monitor in real time every individual ion injection by using an efficient scintillator or a thin diamond particle detector in both heavy-ion and high-energy heavy-ion microbeam systems. (C) 2014 Elsevier B.V. All rights reserved.