Thickness dependence of mobility of pentacene planar bottom-contact organic thin-film transistors

被引:16
作者
Xu, M.
Nakamura, M.
机构
[1] Venture Business Laboratory, Chiba University, Inage-ku, Chiba-shi, Chiba, 263-8522, 1-33, Yayoi-cho
[2] Department of Electrical and Electronic Engineering, Chiba University, Inage-ku, Chiba-shi, Chiba, 263-8522, 1-33, Yayoi-cho
关键词
D O I
10.1016/j.tsf.2007.04.115
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have fabricated planar bottom-contact organic thin-film transistors as a function of the thickness of the pentacene active layer. The highest mobility of the planar bottom-contact transistors is 0.47 cm2/Vs with only a 7 nm pentacene active layer. Our planar bottom-contact transistors show much higher mobility than conventional bottom-contact counterparts and even higher than the reported mobility values of top-contact counterparts for each thickness in the range from 2.5 to 10 nm. We find that spike at the edges of source and drain electrodes seriously deteriorates device performance. © 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:2776 / 2778
页数:3
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