Investigation of Copper Plating and Additive Interactions in the Presence of Fe3+/Fe2+ Redox Couple

被引:14
作者
Volov, Igor [1 ]
Saito, Tadashi [2 ]
West, Alan C. [1 ]
机构
[1] Columbia Univ, Dept Chem Engn, New York, NY 10027 USA
[2] Atotech Japan KK, Midori Ku, Kanagawa 2260006, Japan
关键词
POLYETHYLENE-GLYCOL; TRIBLOCK COPOLYMER; BUMP FORMATION; CHLORIDE-ION; L-CYSTEINE; ELECTRODEPOSITION; PEG; SPS; DEPOSITION; ACID;
D O I
10.1149/1.3575638
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The impact of the ferric/ferrous (Fe3+/Fe2+) redox couple on the behavior of polyethylene glycol (PEG) and bis-(3-sulfopropyl) disulfide (SPS) during copper electrodeposition is investigated. The Fe3+/Fe2+ couple is used in plating of copper onto printed circuit boards and may have advantages when implemented for on-chip metallization of copper. Experiments show that in the presence of Fe3+/Fe2+ the suppressing behavior of PEG does not change; in contrast, the accelerating activity of SPS increases when Fe3+/Fe2+ is present in a copper-plating bath. Furthermore, potentiostatic experiments suggest that SPS interacts with Fe2+ ions in the bulk electrolyte, probably to produce 3-mercapto-1-propane sulfonic acid (MPS) at low ppb levels. (C) 2011 The Electrochemical Society. [DOI: 10.1149/1.3575638] All rights reserved.
引用
收藏
页码:D384 / D389
页数:6
相关论文
共 45 条
[1]  
ADOLF JD, 2009, VIENN AUSTR OCT 5 20, V902, P2163
[2]  
Andricacos P., 2010, Void-Free Damascene Copper Deposition Process and Means of Monitoring Thereof
[3]   Damascene copper electroplating for chip interconnections [J].
Andricacos, PC ;
Uzoh, C ;
Dukovic, JO ;
Horkans, J ;
Deligianni, H .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1998, 42 (05) :567-574
[4]  
BARTHELMES J, 1999, P ELECT CIRCUITS WOR, V8
[5]   SPE-HPLC detection of organic additives in acidic copper plating baths - I. Sulfopropyl disulfide-based brighteners [J].
D'Urzo, L ;
Wang, HH ;
Pa, A ;
Zhi, C .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (04) :C243-C247
[6]   Roles of chloride ion in microvia filling by copper electrodeposition - I. Studies using SEM and optical microscope [J].
Dow, WP ;
Huang, HS .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (02) :C67-C76
[7]  
EISDEN JV, 2009, SAN FRANC FL MAY 25, V901, P979
[8]   EFFECT OF THIOUREA, BENZOTRIAZOLE AND 4,5-DITHIAOCTANE-1,8-DISULFONIC ACID ON THE KINETICS OF COPPER DEPOSITION FROM DILUTE-ACID SULFATE-SOLUTIONS [J].
FARNDON, EE ;
WALSH, FC ;
CAMPBELL, SA .
JOURNAL OF APPLIED ELECTROCHEMISTRY, 1995, 25 (06) :574-583
[9]   PEG, PPG, and their triblock copolymers as suppressors in copper electroplating [J].
Gallaway, Joshua W. ;
West, Alan C. .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2008, 155 (10) :D632-D639
[10]   Copper Filling of 100 nm Trenches Using PEG, PPG, and a Triblock Copolymer as Plating Suppressors [J].
Gallaway, Joshua W. ;
Willey, Mark J. ;
West, Alan C. .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2009, 156 (08) :D287-D295