Full-field hard X-ray microscopy based on aberration-corrected Be CRLs

被引:2
作者
Schropp, Andreas [1 ]
Brueckner, Dennis [1 ,2 ]
Bulda, Jessica [1 ]
Falkenberg, Gerald [1 ]
Garrevoet, Jan [1 ]
Hagemann, Johannes [1 ]
Seiboth, Frank [1 ]
Spiers, Kathryn [1 ]
Koch, Frieder [3 ]
David, Christian [3 ]
Gambino, Marianna [4 ]
Vesely, Martin [4 ]
Meirer, Florian [4 ]
Schroer, Christian G. [1 ,3 ,5 ]
机构
[1] Deutsch Elektronen Synchrotron DESY, Notkestr 85, D-22607 Hamburg, Germany
[2] Ruhr Univ Bochum, Univ Str 150, D-44780 Bochum, Germany
[3] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[4] Univ Utrecht, Univ Weg 99, NL-3584 CG Utrecht, Netherlands
[5] Univ Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany
来源
X-RAY NANOIMAGING: INSTRUMENTS AND METHODS IV | 2019年 / 11112卷
关键词
hard X-ray microscopy; full-field imaging; tomography; refractive X-ray optics; compound refractive lenses; corrective phase plates; REFRACTIVE LENSES; TOMOGRAPHY;
D O I
10.1117/12.2528422
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
To date, compound refractive X-ray lenses made out of Beryllium (Be CRLs) have been seldom applied for full-field microscopy with high spatial resolution, which was probably due to residual aberrations of these optics. However, in combination with the recent development of made-to-measure phase plates, the typical spherical aberration of beryllium compound refractive lenses (Be CRLs) can now be completely removed. In this way, distortion-free images of a sample are obtained, which is especially important for tomographic applications. First full-field imaging experiments with aberration-corrected Be CRLs were carried out at beamline P06 at the synchrotron radiation X-ray source PETRA III (DESY Hamburg, Germany). In order to maximize the magnification of the X-ray microscope for full-field microscopy, the full length of the beamline combining the micro- and nanohutch was utilized, enabling a large sample-to-detector distance. In this contribution, we present first imaging results, demonstrating the potential of Be CRLs for direct high-resolution X-ray tomography.
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页数:7
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