Production of powerful electron beams in dense gases

被引:50
作者
Tarasenko, VF
Yakovlenko, SI
Orlovskii, VM
Tkachev, AN
Shunailov, SA
机构
[1] Russian Acad Sci, Inst High Current Elect, Siberian Div, Tomsk 634055, Russia
[2] Russian Acad Sci, Inst Gen Phys, Moscow 119991, Russia
[3] Russian Acad Sci, Inst Electrophys, Ural Div, Ekaterinburg 620049, Russia
关键词
D O I
10.1134/1.1600816
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Subnanosecond electron beams with the record current amplitude (similar to70 A in air and similar to200 A in helium) were produced at atmospheric pressure. The optimal generator open-circuit voltage was found for which the electron-beam current amplitude produced in a gas diode was maximal behind a foil. It was established that the electron beam was produced at the stage when the cathode plasma closely approaches the anode. It was shown that a high-current beam can be produced at high pressures because of the presence of the upper branches in the curves characterizing the electron-escape (runaway) criterion and the discharge-ignition criterion (Paschen curve). (C) 2003 MAIK "Nauka / Interperiodica".
引用
收藏
页码:611 / 615
页数:5
相关论文
共 12 条
[1]   HIGH-VOLTAGE NANOSECOND DISCHARGE IN DENSE GASES DEVELOPING WITH RUNAWAY ELECTRONS REGIME UNDER HIGH OVERVOLTAGES [J].
BABICH, LP ;
LOIKO, TV ;
TSUKERMAN, VA .
USPEKHI FIZICHESKIKH NAUK, 1990, 160 (07) :49-82
[2]  
Batygin V. V., 1964, Problem sin electrodynamics
[3]  
DIKIDZHI AN, 1955, ZH TEKH FIZ+, V25, P1038
[4]  
GUBANOV VP, 1996, IZV VYSSH UCHEBN ZAV, P110
[5]  
KOROLEV YD, 1991, PHYSICS PULSE BREAKD
[6]   A SEARCH FOR X-RAYS FROM HELIUM AND AIR DISCHARGES AT ATMOSPHERIC PRESSURE [J].
NOGGLE, RC ;
KRIDER, EP ;
WAYLAND, JR .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (10) :4746-&
[7]  
Penning F. M, 1932, PHYSICA, V12, P65
[8]  
RAIZER YP, 1992, PHYSICS GAS DISCHARG
[9]  
STANKEVICH YE, 1967, SOV PHYS DOKL, V12, P1042
[10]   On the mechanism of the runaway of electrons in a gas: The upper branch of the self-sustained discharge ignition curve [J].
Tkachev, AN ;
Yakovlenko, SI .
JETP LETTERS, 2003, 77 (05) :221-225