Influence of substrate morphology on growth mode of thin organic films: An atomic force microscopy study

被引:7
|
作者
Ribic, Primoz Rebernik [1 ]
Bratina, Gvido [1 ]
机构
[1] Univ Nova Gorica, Lab Epitaxy & Nanostruct, Ajdovscina 5270, Slovenia
来源
关键词
D O I
10.1116/1.2743654
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Morphology of high-vacuum deposited thin films of pentacene and rubrene on annealed vicinal (0001) sapphire surfaces was studied by atomic force microscopy in non-contact mode. Pentacene molecules in the first monolayer form two-dimensional islands with an average height of 1.5 nm. The majority of islands nucleate at the steps on the sapphire surface. Surface steps also act as nucleation sites for subsequent monolayers of pentacene. The terrace-and-step morphology of the substrate surface has a larger impact in the case of rubrene thin film growth. Rubrene grows in wire-like structures that follow the direction of the steps. In the case of rubrene films with a nominal thickness of 10 nm, the typical widths and heights of the wires are 150 and 5 nm, respectively. The separation between the wires is determined by the terrace width on the substrate surface. The difference in the morphology of pentacene and rubrene films may be explained by taking into account different geometries of the two molecules. (c) 2007 American Vacuum Society.
引用
收藏
页码:1152 / 1155
页数:4
相关论文
共 50 条
  • [31] Comments on the use of the force mode in atomic force microscopy for polymer films
    Aime, J.P.
    Elkaakour, Z.
    Odin, C.
    Bouhacina, T.
    Michel, D.
    Curely, J.
    Dautant, A.
    Journal of Applied Physics, 1994, 76 (02):
  • [32] Characterization of organic epitaxial films by atomic force microscopy
    Tada, H
    Mashiko, S
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1995, 267 : 145 - 150
  • [33] Adhesion mode atomic force microscopy study of dual component protein films
    Agnihotri, A
    Siedlecki, CA
    ULTRAMICROSCOPY, 2005, 102 (04) : 257 - 268
  • [34] Study of liquid crystal prewetting films by atomic force microscopy in tapping mode
    Bardon, S
    Valignat, MP
    Cazabat, AM
    Stocker, W
    Rabe, JP
    LANGMUIR, 1998, 14 (10) : 2916 - 2924
  • [35] Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD
    Klapetek, P
    Ohlídal, I
    Ramil, AM
    Bonnanni, A
    Sitter, H
    VACUUM, 2005, 80 (1-3) : 53 - 57
  • [36] Thermal induced instability of thin polymer films: A study by atomic force microscopy
    Gan, DJ
    Cao, WJ
    Puat, NE
    HIGH PERFORMANCE POLYMERS, 2001, 13 (04) : 259 - 267
  • [37] GROWTH OF CONJUGATED OLIGOMER THIN-FILMS STUDIED BY ATOMIC-FORCE MICROSCOPY
    BISCARINI, F
    ZAMBONI, R
    SAMORI, P
    OSTOJA, P
    TALIANI, C
    PHYSICAL REVIEW B, 1995, 52 (20): : 14868 - 14877
  • [38] Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle-substrate chemistry and morphology, and of operating conditions
    Darwich, Samer
    Mougin, Karine
    Rao, Akshata
    Gnecco, Enrico
    Jayaraman, Shrisudersan
    Haidara, Hamidou
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2011, 2 : 85 - 98
  • [39] Surface morphology of polymer films imaged by atomic force microscopy
    Vancso, GJ
    Allston, TD
    Chun, I
    Johansson, LS
    Liu, GB
    Smith, PF
    INTERNATIONAL JOURNAL OF POLYMER ANALYSIS AND CHARACTERIZATION, 1996, 3 (01) : 89 - 105
  • [40] ELASTICITY, WEAR, AND FRICTION PROPERTIES OF THIN ORGANIC FILMS OBSERVED WITH ATOMIC-FORCE MICROSCOPY
    OVERNEY, RM
    BONNER, T
    MEYER, E
    REUTSCHI, M
    LUTHI, R
    HOWALD, L
    FROMMER, J
    GUNTHERODT, HJ
    FUJIHARA, M
    TAKANO, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 1973 - 1976