Secondary extinction used in thickness and pole density measurements of textured films by X-ray diffraction

被引：1
|
作者：
Tomov, I [1 ]
机构：
[1] Bulgarian Acad Sci, Inst Phys Chem, BG-1113 Sofia, Bulgaria
来源：
TEXTURE AND ANISOTROPY OF POLYCRYSTALS | 1998年 / 273-2卷
关键词：
textures; thickness; extinction; X-ray diffraction; pole density; thin films;
D O I：
10.4028/www.scientific.net/MSF.273-275.145
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A new X-ray diffraction method for a more accurate determination of film thickness and pole densities is developed by introducing a secondary extinction correction. For the purpose an equation based on the kinematic theory of X-ray diffraction and the mosaic crystal model has been derived. The discussion of results shows that the correct characterization of textured films requires in general the secondary extinction to be taken into account.
引用
收藏
页码：145 / 150
页数：6
相关论文
共 50 条
  • [21] Image plate X-ray diffraction and X-ray reflectivity characterization of protective coatings and thin films
    Lee, SL
    Windover, D
    Doxbeck, M
    Nielsen, M
    Kumar, A
    Lu, TM
    THIN SOLID FILMS, 2000, 377 : 447 - 454
  • [22] The first X-ray diffraction measurements on Mars
    Bish, David
    Blake, David
    Vaniman, David
    Sarrazin, Philippe
    Bristow, Thomas
    Achilles, Cherie
    Dera, Przemyslaw
    Chipera, Steve
    Crisp, Joy
    Downs, R. T.
    Farmer, Jack
    Gailhanou, Marc
    Ming, Doug
    Morookian, John Michael
    Morris, Richard
    Morrison, Shaunna
    Rampe, Elizabeth
    Treiman, Allan
    Yen, Albert
    IUCRJ, 2014, 1 : 514 - 522
  • [23] Depth-resolved strain measurements in thin films by energy-variable X-ray diffraction
    Zolotoyabko, E
    Pokroy, B
    Cohen-Hyams, T
    Quintana, JP
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 246 (01) : 244 - 248
  • [24] Anisotropic crystallite size analysis of textured nanocrystalline silicon thin films probed by X-ray diffraction
    Morales, M
    Leconte, Y
    Rizk, R
    Chateigner, D
    THIN SOLID FILMS, 2004, 450 (01) : 216 - 221
  • [25] ESR and X-ray diffraction measurements of Nd substituted yttrium aluminum garnet films
    Jablonski, R
    Sarnecki, J
    Mazur, K
    Sass, J
    Skwarcz, J
    JOURNAL OF ALLOYS AND COMPOUNDS, 2000, 300 : 316 - 321
  • [26] X-ray diffraction spectroscopy and X-ray photoelectron spectroscopy studies of Cu-doped ZnO films
    Xue, H.
    Chen, Y.
    Xu, X. L.
    Zhang, G. H.
    Zhang, H.
    Ma, S. Y.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2009, 41 (05) : 788 - 791
  • [27] Effects of epitaxial films of nanometric thickness on the X-ray photoelectron diffraction intensities from substrates
    Atrei, A.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2012, 185 (11) : 470 - 474
  • [28] THE IMPACT OF ACCURATE EXTINCTION MEASUREMENTS FOR X-RAY SPECTRAL MODELS
    Smith, Randall K.
    Valencic, Lynne A.
    Corrales, Lia
    ASTROPHYSICAL JOURNAL, 2016, 818 (02)
  • [29] Back-to-Basics tutorial: X-ray diffraction of thin films
    Harrington, George F.
    Santiso, Jose
    JOURNAL OF ELECTROCERAMICS, 2021, 47 (04) : 141 - 163
  • [30] Multiscale measurements on temperature-dependent deformation of a textured magnesium alloy with synchrotron x-ray imaging and diffraction
    Lu, L.
    Bie, B. X.
    Li, Q. H.
    Sun, T.
    Fezzaa, K.
    Gong, X. L.
    Luo, S. N.
    ACTA MATERIALIA, 2017, 132 : 389 - 394
12345