New levels of high angular resolution EBSD performance via inverse compositional Gauss-Newton based digital image correlation

被引:22
|
作者
Ruggles, T. J. [1 ]
Bomarito, G. F. [2 ]
Qiu, R. L. [3 ]
Hochhalter, J. D. [2 ]
机构
[1] Natl Inst Aerosp, 100 Explorat Way, Hampton, VA 23666 USA
[2] Natl Air & Space Adm, Hampton, VA 23666 USA
[3] Roanoke Valley Governors Sch Sci & Technol, Roanoke, VA 24015 USA
关键词
HREBSD; DIC; Simulated EBSD patterns; ELECTRON BACKSCATTER DIFFRACTION; DISLOCATION DENSITY; CORRELATION CRITERIA; KIKUCHI DIFFRACTION; HR-EBSD; LOCALIZATION; PRECISION; PATTERNS; STRAINS;
D O I
10.1016/j.ultramic.2018.08.020
中图分类号
TH742 [显微镜];
学科分类号
摘要
Conventional high angular resolution electron backscatter diffraction (HREBSD) uses cross-correlation to track features between diffraction patterns, which are then related to the relative elastic strain and misorientation between the diffracting volumes of material. This paper adapts inverse compositional Gauss Newton (ICGN) digital image correlation (DIC) to be compatible with HREBSD. ICGN-based works by efficiently tracking not just the shift in features, but also the change in their shape. Modeling a shape change as well as a shift results in greater accuracy. This method, ICGN-based HREBSD, is applied to a simulated data set, and its performance is compared to conventional cross-correlation HREBSD, and cross-correlation HREBSD with remapping. ICGN-based HREBSD is shown to have about half the strain error of the best cross-correlation method with a comparable computation time.
引用
收藏
页码:85 / 92
页数:8
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