X-ray resolution tests of an off-plane reflection grating for IXO

被引：0
|
作者：
Zeiger, Benjamin R. [1 ]
Shipley, Ann [1 ]
Cash, Webster [1 ]
McEntaffer, Randall [2 ]
机构：
[1] Univ Colorado, Ctr Astrophys & Space Astron, 593 UCB, Boulder, CO 80303 USA
[2] Univ Iowa, Iowa City, IA 52242 USA
来源：
SPACE TELESCOPES AND INSTRUMENTATION 2010: ULTRAVIOLET TO GAMMA RAY | 2010年 / 7732卷
关键词：
spectroscopy; International X-ray Observatory; diffraction grating; off-plane grating;
D O I：
10.1117/12.857503
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
We describe the experimental apparatus in use to test an off-plane reflection grating for the soft x-ray (0.3-1.0 keV) bandpass. The grating is a prototype for the X-ray Grating Spectrometer on the International X-ray Observatory (IXO). It has holographically-ruled radial grooves to match the converging beam of a 6.5 m focal length telescope. Laboratory tests are ongoing, with ray tracing indicating that a resolution (Delta E/E) >3,000 is achievable across the 0.3-1.0 keV bandpass-the requirement to achieve IXO science goals.
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页数：6
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