X-ray resolution tests of an off-plane reflection grating for IXO

被引：0

作者：

Zeiger, Benjamin R. ^{[1
]}

Shipley, Ann ^{[1
]}

Cash, Webster ^{[1
]}

McEntaffer, Randall ^{[2
]}

机构：

[1] Univ Colorado, Ctr Astrophys & Space Astron, 593 UCB, Boulder, CO 80303 USA

[2] Univ Iowa, Iowa City, IA 52242 USA

来源：

SPACE TELESCOPES AND INSTRUMENTATION 2010: ULTRAVIOLET TO GAMMA RAY | 2010年 / 7732卷

关键词：

spectroscopy; International X-ray Observatory; diffraction grating; off-plane grating;

D O I：

10.1117/12.857503

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

We describe the experimental apparatus in use to test an off-plane reflection grating for the soft x-ray (0.3-1.0 keV) bandpass. The grating is a prototype for the X-ray Grating Spectrometer on the International X-ray Observatory (IXO). It has holographically-ruled radial grooves to match the converging beam of a 6.5 m focal length telescope. Laboratory tests are ongoing, with ray tracing indicating that a resolution (Delta E/E) >3,000 is achievable across the 0.3-1.0 keV bandpass-the requirement to achieve IXO science goals.

引用

页数：6

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