On the Manipulation of Ferroelectric and Ferroelastic Domains at the Nanoscale

被引：2

作者：

Durkan, Colm ^{[1
]}

Garcia-Melendrez, Jose Angel ^{[1
]}

Ding, Long ^{[1
]}

机构：

[1] Univ Cambridge, Nanosci Ctr, Cambridge CB3 0FF, England

来源：

JOURNAL OF ELECTRONIC MATERIALS | 2015年 / 44卷 / 07期

关键词：

Ferroelectric; piezoelectric; domain; microscopy; SCANNING FORCE MICROSCOPY; CONDUCTION; SCALE; WALLS; FILMS;

D O I：

10.1007/s11664-015-3674-z

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The distribution and evolution of ferroelectric and ferroelastic nanodomains in a polycrystalline (001)-oriented thin film of the simple multiferroic PbZr0.3Ti0.7O3 (PZT) are presented. With an external electric field applied between the probe tip and the PZT sample, ferroelastic domains were switched by rotating both in and out of plane, with partial conversion from a-oriented regions to c-oriented regions. After multiple such cycles, grains were observed to buckle as a direct consequence of the lateral size change arising from the conversion towards complete c-orientation. The factors determining the measured deflection of the cantilever in piezoresponse force microscopy were explored, highlighting the conditions under which quantitative or qualitative information may be obtained.

引用

页码：2230 / 2242

页数：13

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